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ISO International Standard

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Purchase ISO Standard

  • Publication Date: 2005-11-16
  • Ref: ISO 18452:2005
  • stdNumber: 18452
  • Version: 1
  • Edition: 1
  • Pages: 9

$68.93

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