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Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
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Surface chemical analysis — Handling of specimens prior to analysis
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Surface chemical analysis — Information formats
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Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
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Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
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Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containing compounds
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Surface chemical analysis — Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
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Surface chemical analysis — Sample handling, preparation and mounting — Part 3: Biomaterials
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Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
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Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope
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Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
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